160. Atom Probe Microscopy (2012).pdf

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Springer Series in
MATERIALS SCIENCE
160
Springer Series in
MATERIALS SCIENCE
Editors:
R. Hull
C. Jagadish
R.M. Osgood, Jr.
J. Parisi
Z.M. Wang
The Springer Series in Materials Science covers the complete spectrum of materials physics,
including fundamental principles, physical properties, materials theory and design. Recognizing
the increasing importance of materials science in future device technologies, the book titles in this
series reflect the state-of-the-art in understanding and controlling the structure and properties
of all important classes of materials.
For further volumes:
http://www.springer.com/series/856
Baptiste Gault Michael P. Moody
Julie M. Cairney Simon P. Ringer
l
l
Atom Probe Microscopy
Baptiste Gault
Department of Materials Science
and Engineering, McMaster University
Hamilton, ON, Canada
Julie M. Cairney
Australian Centre for Microscopy
and Microanalysis
The University of Sydney
Sydney, NSW, Australia
Michael P. Moody
Department of Materials
University of Oxford
Oxford, Oxon, UK
Simon P. Ringer
Australian Centre for Microscopy
and Microanalysis
The University of Sydney
Sydney, NSW, Australia
ISSN 0933-033X
ISBN 978-1-4614-3435-1
e-ISBN 978-1-4614-3436-8
DOI 10.1007/978-1-4614-3436-8
Springer New York Heidelberg Dordrecht London
Library of Congress Control Number: 2012936826
#
Springer Science+Business Media, LLC 2012
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